Extraction of Underwater Laver Cultivation Nets by SAR Polarimetric Entropy SCIE SCOPUS

Cited 6 time in WEB OF SCIENCE Cited 10 time in Scopus
Title
Extraction of Underwater Laver Cultivation Nets by SAR Polarimetric Entropy
Author(s)
Won, Eun-Sung; Ouchi, Kazuo; Yang, Chan-Su
KIOST Author(s)
Yang, Chan Su(양찬수)
Alternative Author(s)
양찬수
Publication Year
2013-03
Abstract
This letter describes a technique of extracting and estimating the underwater laver cultivation nets by using the entropy analysis of polarimetric synthetic aperture radar (PolSAR) data. The cultivation nets are placed at 10-20 cm below the sea surface, so that the Bragg waves responsible for L-band radar backscatter do not fully develop in this area of effectively shallow water. Consequently, the surface becomes smooth, and the backscatter radar cross section (RCS) becomes small in comparison with that from deep water without cultivation nets. If RCS from the cultivation area is at the system noise level, the image can be considered as arising from a random process, and the polarimetric entropy should be higher than the open sea area where the radar backscatter is dominated by the single-bounce surface scattering process. We will show that, using the data acquired by Phased Array L-band SAR onboard the Advanced Land Observing Satellite over the Tokyo Bay, Japan, the polarimetric entropy is an effective means of extracting underwater cultivation areas in comparison with the amplitude images. The area of the laver cultivation is then estimated by applying a constant false alarm rate to the entropy images to yield good agreement with the ground-truth data.
ISSN
1545-598X
URI
https://sciwatch.kiost.ac.kr/handle/2020.kiost/3213
DOI
10.1109/LGRS.2012.2199077
Bibliographic Citation
IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, v.10, no.2, pp.231 - 235, 2013
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Advanced Land Observing Satellite (ALOS)Phased Array L-band Synthetic Aperture Radar (PALSAR); constant false alarm rate (CFAR); effective surface roughness; polarimetric entropy; underwater marine cultivation
Type
Article
Language
English
Document Type
Article
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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