Quality factor in clamping loss of nanocantilever resonators SCIE SCOPUS

DC Field Value Language
dc.contributor.author Ko, Jin Hwan -
dc.contributor.author Jeong, Joonho -
dc.contributor.author Choi, Jinbok -
dc.contributor.author Cho, Maenghyo -
dc.date.accessioned 2020-04-20T07:43:55Z -
dc.date.available 2020-04-20T07:43:55Z -
dc.date.created 2020-01-28 -
dc.date.issued 2011-04-25 -
dc.identifier.issn 0003-6951 -
dc.identifier.uri https://sciwatch.kiost.ac.kr/handle/2020.kiost/3871 -
dc.description.abstract Clamping loss caused by elastic wave radiation to a support is one of the most dominant loss mechanisms in predicting the quality factor of very or ultra high frequency nanocantilever resonators. To consider nanosurface effects and different scales of the resonator and support, we propose a multiscale model combining a scale-bridging model for the resonator and a perfectly matched layer to estimate the loss in the support. The proposed model is used to investigate the surface effect on the nanoresonator and also shows the tradeoff between the resonant frequency and the quality factor with or without the surface effects. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3575560] -
dc.description.uri 1 -
dc.language English -
dc.publisher AMER INST PHYSICS -
dc.title Quality factor in clamping loss of nanocantilever resonators -
dc.type Article -
dc.citation.title APPLIED PHYSICS LETTERS -
dc.citation.volume 98 -
dc.citation.number 17 -
dc.contributor.alternativeName 고진환 -
dc.identifier.bibliographicCitation APPLIED PHYSICS LETTERS, v.98, no.17 -
dc.identifier.doi 10.1063/1.3575560 -
dc.identifier.scopusid 2-s2.0-79955677515 -
dc.identifier.wosid 000290046100020 -
dc.type.docType Article -
dc.description.journalClass 1 -
dc.relation.journalWebOfScienceCategory Physics, Applied -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Physics -
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